TEST_NAME : Wafer
TEST_DATE : 24_09_23-17_28_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-031-004-023-15 | FUSED_ID : 6359364768405406079
  IC_TEMP :  -88.03 | VDDM : 1107.48 | AUX_INT :  -11.94 | CsaBias :   58.20
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.32465e-03 / 2
  ADC_P0  : -1.19437e-02 ± 3.27620e-02
  ADC_P1  : 8.81786e-03 ± 8.35350e-04
  ADC_P2  : -6.23160e-06 ± 4.27122e-06
  CSA_Chi2/NDF : 1.94610e-04 / 2
  CSA_P0  : 5.62085e-02 ± 9.30476e-03
  CSA_P1  : 1.02225e-02 ± 7.01046e-04
  CSA_P2  : -6.73798e-05 ± 1.06761e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [83]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [8, 10, 43, 92]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.1509', '1.800', '0.1512', '1.800', '0.0833', '7.000', '0.7071', 1, 1, 1, 1, 1727105303.3859892]
VI_after__Init : ['1.202', '0.1509', '1.800', '0.1512', '1.800', '0.0777', '7.000', '0.7069', 1, 1, 1, 1, 1727105311.347481]
VI_at__the_End : ['1.202', '0.4280', '1.800', '0.1336', '1.800', '0.1163', '7.000', '0.7077', 1, 1, 1, 1, 1727105380.8479707]