TEST_NAME : Wafer
TEST_DATE : 24_09_23-18_13_48
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-031-006-008-11 | FUSED_ID : 6359364768405414027
  IC_TEMP :  -72.94 | VDDM : 1120.63 | AUX_INT :   -8.67 | CsaBias :   61.16
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.42021e-03 / 2
  ADC_P0  : -8.66688e-03 ± 2.55258e-02
  ADC_P1  : 8.78267e-03 ± 6.49099e-04
  ADC_P2  : -6.85800e-06 ± 3.26375e-06
  CSA_Chi2/NDF : 1.97781e-04 / 2
  CSA_P0  : 5.58047e-02 ± 9.38026e-03
  CSA_P1  : 9.81008e-03 ± 7.06735e-04
  CSA_P2  : -5.37436e-05 ± 1.07627e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3517', '1.800', '0.1564', '1.799', '0.1011', '7.000', '0.7082', 1, 1, 1, 1, 1727108028.3686013]
VI_after__Init : ['1.202', '0.3519', '1.800', '0.1566', '1.800', '0.0958', '7.000', '0.7079', 1, 1, 1, 1, 1727108036.5510645]
VI_at__the_End : ['1.202', '0.4557', '1.800', '0.1356', '1.800', '0.1192', '7.000', '0.7088', 1, 1, 1, 1, 1727108105.0588763]