TEST_NAME : Wafer
TEST_DATE : 24_09_23-18_15_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-031-006-009-11 | FUSED_ID : 6359364768405414043
  IC_TEMP :  -71.80 | VDDM : 1111.50 | AUX_INT :  -11.87 | CsaBias :   65.65
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.29816e-03 / 2
  ADC_P0  : -1.18722e-02 ± 3.25517e-02
  ADC_P1  : 8.67126e-03 ± 8.09943e-04
  ADC_P2  : -6.37160e-06 ± 4.03204e-06
  CSA_Chi2/NDF : 2.00304e-04 / 2
  CSA_P0  : 5.65457e-02 ± 9.43988e-03
  CSA_P1  : 1.00866e-02 ± 7.11227e-04
  CSA_P2  : -5.93397e-05 ± 1.08311e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [66]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [66, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3550', '1.800', '0.1482', '1.800', '0.0968', '7.000', '0.7088', 1, 1, 1, 1, 1727108125.8862681]
VI_after__Init : ['1.202', '0.3550', '1.800', '0.1484', '1.800', '0.0894', '7.000', '0.7080', 1, 1, 1, 1, 1727108133.877729]
VI_at__the_End : ['1.201', '0.4537', '1.800', '0.1345', '1.800', '0.1189', '7.000', '0.7086', 1, 1, 1, 1, 1727108194.1881506]