TEST_NAME : Wafer
TEST_DATE : 24_09_23-18_20_19
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-031-006-012-11 | FUSED_ID : 6359364768405414091
  IC_TEMP :  -73.48 | VDDM : 1116.68 | AUX_INT :   -9.21 | CsaBias :   68.16
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.38107e-03 / 2
  ADC_P0  : -9.20696e-03 ± 2.51510e-02
  ADC_P1  : 8.65803e-03 ± 6.24792e-04
  ADC_P2  : -6.79547e-06 ± 3.08014e-06
  CSA_Chi2/NDF : 1.95996e-04 / 2
  CSA_P0  : 5.57554e-02 ± 9.33782e-03
  CSA_P1  : 9.58103e-03 ± 7.03537e-04
  CSA_P2  : -5.21728e-05 ± 1.07140e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3319', '1.800', '0.1504', '1.800', '0.0994', '7.000', '0.7081', 1, 1, 1, 1, 1727108419.7808695]
VI_after__Init : ['1.202', '0.3317', '1.800', '0.1505', '1.800', '0.0943', '7.000', '0.7079', 1, 1, 1, 1, 1727108427.7743585]
VI_at__the_End : ['1.200', '0.4466', '1.800', '0.1337', '1.800', '0.1167', '7.000', '0.7087', 1, 1, 1, 1, 1727108488.0547163]