TEST_NAME : Wafer
TEST_DATE : 24_09_23-19_21_56
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-031-007-003-06 | FUSED_ID : 6359364768405418038
  IC_TEMP :  -74.66 | VDDM : 1117.78 | AUX_INT :   -8.66 | CsaBias :   52.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.59731e-03 / 2
  ADC_P0  : -8.65674e-03 ± 2.70019e-02
  ADC_P1  : 8.71907e-03 ± 6.60979e-04
  ADC_P2  : -7.77928e-06 ± 3.18948e-06
  CSA_Chi2/NDF : 1.56262e-04 / 2
  CSA_P0  : 5.34656e-02 ± 8.33774e-03
  CSA_P1  : 9.43695e-03 ± 6.28189e-04
  CSA_P2  : -4.84845e-05 ± 9.56657e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [102, 123, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [41, 61]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3378', '1.800', '0.1425', '1.800', '0.0989', '7.000', '0.7082', 1, 1, 1, 1, 1727112116.4628632]
VI_after__Init : ['1.202', '0.3386', '1.800', '0.1427', '1.800', '0.0930', '7.000', '0.7081', 1, 1, 1, 1, 1727112124.5031664]
VI_at__the_End : ['1.202', '0.4506', '1.800', '0.1305', '1.800', '0.1204', '7.000', '0.7088', 1, 1, 1, 1, 1727112186.619907]