TEST_NAME : Wafer
TEST_DATE : 24_09_23-19_20_19
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-031-007-004-06 | FUSED_ID : 6359364768405418054
  IC_TEMP :  -70.16 | VDDM : 1107.24 | AUX_INT :   -9.62 | CsaBias :   51.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.59930e-03 / 2
  ADC_P0  : -9.61901e-03 ± 2.71259e-02
  ADC_P1  : 8.84536e-03 ± 6.96897e-04
  ADC_P2  : -6.55599e-06 ± 3.56228e-06
  CSA_Chi2/NDF : 2.23903e-04 / 2
  CSA_P0  : 5.62112e-02 ± 9.98050e-03
  CSA_P1  : 9.83687e-03 ± 7.51959e-04
  CSA_P2  : -5.42458e-05 ± 1.14514e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1567', '1.800', '0.1565', '1.800', '0.0863', '7.000', '0.7079', 1, 1, 1, 1, 1727112018.572212]
VI_after__Init : ['1.202', '0.1567', '1.800', '0.1565', '1.800', '0.0806', '7.000', '0.7079', 1, 1, 1, 1, 1727112026.75139]
VI_at__the_End : ['1.202', '0.4550', '1.800', '0.1380', '1.800', '0.1177', '7.000', '0.7085', 1, 1, 1, 1, 1727112091.5370057]