TEST_NAME : Wafer
TEST_DATE : 24_09_23-19_12_11
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-031-007-009-06 | FUSED_ID : 6359364768405418134
  IC_TEMP :  -63.84 | VDDM : 1112.81 | AUX_INT :   -9.02 | CsaBias :   75.91
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.84004e-03 / 2
  ADC_P0  : -9.01709e-03 ± 2.91094e-02
  ADC_P1  : 8.55603e-03 ± 7.21033e-04
  ADC_P2  : -6.28939e-06 ± 3.54912e-06
  CSA_Chi2/NDF : 1.93579e-04 / 2
  CSA_P0  : 5.63923e-02 ± 9.28008e-03
  CSA_P1  : 9.96877e-03 ± 6.99187e-04
  CSA_P2  : -5.39516e-05 ± 1.06478e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [4, 55]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [10, 53, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4748', '1.800', '0.1366', '1.800', '0.0963', '7.000', '0.7082', 1, 1, 1, 1, 1727111530.747539]
VI_after__Init : ['1.202', '0.4760', '1.799', '0.1369', '1.800', '0.0908', '7.000', '0.7080', 1, 1, 1, 1, 1727111538.779919]
VI_at__the_End : ['1.202', '0.4680', '1.800', '0.1353', '1.800', '0.1181', '7.000', '0.7085', 1, 1, 1, 1, 1727111601.3500817]