TEST_NAME : Wafer
TEST_DATE : 24_09_23-19_07_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-031-007-012-06 | FUSED_ID : 6359364768405418182
  IC_TEMP :  -65.59 | VDDM : 1122.23 | AUX_INT :   -9.80 | CsaBias :   73.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.05253e-03 / 2
  ADC_P0  : -9.79954e-03 ± 3.08012e-02
  ADC_P1  : 8.39312e-03 ± 7.58014e-04
  ADC_P2  : -5.64185e-06 ± 3.70787e-06
  CSA_Chi2/NDF : 1.77191e-04 / 2
  CSA_P0  : 5.67754e-02 ± 8.87857e-03
  CSA_P1  : 9.92222e-03 ± 6.68936e-04
  CSA_P2  : -5.22853e-05 ± 1.01871e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [43]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [2]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3743', '1.800', '0.1495', '1.800', '0.0964', '7.000', '0.7076', 1, 1, 1, 1, 1727111238.3645928]
VI_after__Init : ['1.202', '0.3745', '1.800', '0.1495', '1.800', '0.0911', '7.000', '0.7078', 1, 1, 1, 1, 1727111246.4409766]
VI_at__the_End : ['1.202', '0.4679', '1.800', '0.1332', '1.800', '0.1168', '7.000', '0.7083', 1, 1, 1, 1, 1727111309.4752085]