TEST_NAME : Wafer
TEST_DATE : 24_09_23-18_59_10
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-031-007-017-01 | FUSED_ID : 6359364768405418257
  IC_TEMP :  -68.07 | VDDM : 1117.71 | AUX_INT :   -7.70 | CsaBias :   67.17
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28218e-03 / 2
  ADC_P0  : -7.69620e-03 ± 2.42736e-02
  ADC_P1  : 8.37044e-03 ± 5.98341e-04
  ADC_P2  : -5.78499e-06 ± 2.91500e-06
  CSA_Chi2/NDF : 1.84740e-04 / 2
  CSA_P0  : 5.74933e-02 ± 9.06574e-03
  CSA_P1  : 9.98028e-03 ± 6.83038e-04
  CSA_P2  : -5.57567e-05 ± 1.04019e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [71]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2152', '1.800', '0.1575', '1.800', '0.0883', '7.000', '0.7074', 1, 1, 1, 1, 1727110750.6340523]
VI_after__Init : ['1.201', '0.2152', '1.800', '0.1575', '1.800', '0.0828', '7.000', '0.7076', 1, 1, 1, 1, 1727110758.7304657]
VI_at__the_End : ['1.201', '0.4609', '1.800', '0.1336', '1.800', '0.1180', '7.000', '0.7084', 1, 1, 1, 1, 1727110819.6040301]