TEST_NAME : Wafer
TEST_DATE : 24_09_23-18_52_38
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-031-007-021-01 | FUSED_ID : 6359364768405418321
  IC_TEMP :  -62.20 | VDDM : 1129.11 | AUX_INT :   -8.10 | CsaBias :   72.61
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.51728e-03 / 2
  ADC_P0  : -8.10144e-03 ± 2.64179e-02
  ADC_P1  : 8.12773e-03 ± 6.28728e-04
  ADC_P2  : -5.63288e-06 ± 2.95465e-06
  CSA_Chi2/NDF : 1.26409e-04 / 2
  CSA_P0  : 5.63553e-02 ± 7.49914e-03
  CSA_P1  : 9.30591e-03 ± 5.65006e-04
  CSA_P2  : -4.33094e-05 ± 8.60438e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [5, 17, 30, 34, 67]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [53, 61]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2436', '1.800', '0.1183', '1.800', '0.0920', '7.000', '0.7072', 1, 1, 1, 1, 1727110358.4798143]
VI_after__Init : ['1.202', '0.2437', '1.800', '0.1184', '1.800', '0.0870', '7.000', '0.7076', 1, 1, 1, 1, 1727110366.5082507]
VI_at__the_End : ['1.201', '0.4667', '1.800', '0.1321', '1.800', '0.1170', '7.000', '0.7080', 1, 1, 1, 1, 1727110427.8427804]