TEST_NAME : Wafer
TEST_DATE : 24_09_23-20_49_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-031-010-003-01 | FUSED_ID : 6359364768405430321
  IC_TEMP :  -63.95 | VDDM : 1103.13 | AUX_INT :  -19.86 | CsaBias :   57.62
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.04429e-03 / 2
  ADC_P0  : -1.98571e-02 ± 3.11930e-02
  ADC_P1  : 8.67128e-03 ± 7.57761e-04
  ADC_P2  : -7.01990e-06 ± 3.66032e-06
  CSA_Chi2/NDF : 1.63304e-04 / 2
  CSA_P0  : 5.74987e-02 ± 8.52355e-03
  CSA_P1  : 9.89492e-03 ± 6.42188e-04
  CSA_P2  : -4.95810e-05 ± 9.77976e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [94, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4616', '1.799', '0.1681', '1.800', '0.0967', '7.000', '0.7079', 1, 1, 1, 1, 1727117397.1767993]
VI_after__Init : ['1.201', '0.4621', '1.800', '0.1685', '1.800', '0.0912', '7.000', '0.7083', 1, 1, 1, 1, 1727117406.000086]
VI_at__the_End : ['1.202', '0.4797', '1.800', '0.1377', '1.800', '0.1158', '7.000', '0.7086', 1, 1, 1, 1, 1727117473.7428296]