TEST_NAME : Wafer
TEST_DATE : 24_09_23-20_59_43
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-031-010-009-01 | FUSED_ID : 6359364768405430417
  IC_TEMP :  -70.75 | VDDM : 1115.49 | AUX_INT :  -11.59 | CsaBias :   64.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.20145e-03 / 2
  ADC_P0  : -1.15867e-02 ± 3.18376e-02
  ADC_P1  : 8.53372e-03 ± 7.73527e-04
  ADC_P2  : -6.50615e-06 ± 3.75180e-06
  CSA_Chi2/NDF : 1.93139e-04 / 2
  CSA_P0  : 6.02140e-02 ± 9.26951e-03
  CSA_P1  : 1.01527e-02 ± 6.98391e-04
  CSA_P2  : -5.92151e-05 ± 1.06357e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [73]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1622', '1.799', '0.1650', '1.800', '0.0933', '7.000', '0.7086', 1, 1, 1, 1, 1727117983.734408]
VI_after__Init : ['1.201', '0.1621', '1.800', '0.1650', '1.800', '0.0862', '7.000', '0.7081', 1, 1, 1, 1, 1727117991.943807]
VI_at__the_End : ['1.201', '0.4620', '1.805', '0.1359', '1.800', '0.1174', '7.000', '0.7086', 1, 1, 1, 1, 1727118050.4252503]