TEST_NAME : Wafer
TEST_DATE : 24_09_23-21_09_31
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-031-010-015-01 | FUSED_ID : 6359364768405430513
  IC_TEMP :  -71.51 | VDDM : 1112.24 | AUX_INT :   -9.45 | CsaBias :   61.89
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45681e-03 / 2
  ADC_P0  : -9.44680e-03 ± 2.58581e-02
  ADC_P1  : 8.97218e-03 ± 6.72596e-04
  ADC_P2  : -6.85792e-06 ± 3.47770e-06
  CSA_Chi2/NDF : 1.43105e-04 / 2
  CSA_P0  : 6.00265e-02 ± 7.97903e-03
  CSA_P1  : 1.02739e-02 ± 6.01163e-04
  CSA_P2  : -6.01854e-05 ± 9.15500e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [18, 51, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [10, 94, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3279', '1.799', '0.1500', '1.800', '0.0949', '7.000', '0.7080', 1, 1, 1, 1, 1727118570.9218054]
VI_after__Init : ['1.202', '0.3282', '1.800', '0.1500', '1.800', '0.0894', '7.000', '0.7080', 1, 1, 1, 1, 1727118579.0092323]
VI_at__the_End : ['1.202', '0.4629', '1.800', '0.1391', '1.800', '0.1118', '7.000', '0.7088', 1, 1, 1, 1, 1727118644.3310158]