TEST_NAME : Wafer
TEST_DATE : 24_09_23-23_27_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-031-013-006-09 | FUSED_ID : 6359364768405442665
  IC_TEMP :  -63.45 | VDDM : 1120.05 | AUX_INT :  -10.25 | CsaBias :   73.28
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.85569e-03 / 2
  ADC_P0  : -1.02522e-02 ± 2.92220e-02
  ADC_P1  : 8.41449e-03 ± 7.09076e-04
  ADC_P2  : -6.15257e-06 ± 3.42045e-06
  CSA_Chi2/NDF : 1.44192e-04 / 2
  CSA_P0  : 5.81364e-02 ± 8.00926e-03
  CSA_P1  : 9.65721e-03 ± 6.03440e-04
  CSA_P2  : -4.52109e-05 ± 9.18968e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [41]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2125', '1.800', '0.1301', '1.799', '0.0831', '7.000', '0.7077', 1, 1, 1, 1, 1727126877.168054]
VI_after__Init : ['1.202', '0.2125', '1.800', '0.1300', '1.800', '0.0776', '7.000', '0.7075', 1, 1, 1, 1, 1727126885.4013364]
VI_at__the_End : ['1.202', '0.4830', '1.800', '0.1387', '1.800', '0.1139', '7.000', '0.7083', 1, 1, 1, 1, 1727126952.58706]