TEST_NAME : Wafer
TEST_DATE : 24_09_23-23_23_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-031-013-009-09 | FUSED_ID : 6359364768405442713
  IC_TEMP :  -57.29 | VDDM : 1117.58 | AUX_INT : -122.64 | CsaBias :   -5.20
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.72857e-04 / 2
  ADC_P0  : -1.22636e-01 ± 2.34648e-02
  ADC_P1  : 9.92594e-03 ± 5.40755e-04
  ADC_P2  : -1.16226e-05 ± 2.43847e-06
  CSA_Chi2/NDF : 1.10072e-04 / 2
  CSA_P0  : 6.03997e-02 ± 6.99778e-03
  CSA_P1  : 9.38751e-03 ± 5.27232e-04
  CSA_P2  : -4.03962e-05 ± 8.02912e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [27, 31, 43, 64, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [10, 45, 63]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1981', '1.800', '0.1151', '1.800', '0.0897', '7.000', '0.7076', 1, 1, 1, 1, 1727126584.130127]
VI_after__Init : ['1.202', '0.1981', '1.800', '0.1150', '1.799', '0.0845', '7.000', '0.7077', 1, 1, 1, 1, 1727126592.9603739]
VI_at__the_End : ['1.202', '0.4860', '1.800', '0.1365', '1.804', '0.1129', '7.000', '0.7083', 1, 1, 1, 1, 1727126660.1051018]