TEST_NAME : Wafer
TEST_DATE : 24_09_23-23_00_17
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-031-013-023-14 | FUSED_ID : 6359364768405442942
  IC_TEMP :  -55.82 | VDDM : 1124.67 | AUX_INT :   -9.26 | CsaBias :   84.92
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.57830e-03 / 2
  ADC_P0  : -9.25966e-03 ± 2.69594e-02
  ADC_P1  : 7.91006e-03 ± 6.22726e-04
  ADC_P2  : -5.14378e-06 ± 2.85889e-06
  CSA_Chi2/NDF : 9.08125e-05 / 2
  CSA_P0  : 5.63388e-02 ± 6.35617e-03
  CSA_P1  : 9.19388e-03 ± 4.78891e-04
  CSA_P2  : -3.74449e-05 ± 7.29295e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [56]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1526', '1.800', '0.1606', '1.800', '0.0908', '7.000', '0.7072', 1, 1, 1, 1, 1727125217.7133522]
VI_after__Init : ['1.202', '0.1525', '1.800', '0.1606', '1.800', '0.0852', '7.000', '0.7072', 1, 1, 1, 1, 1727125225.7227495]
VI_at__the_End : ['1.202', '0.4822', '1.800', '0.1345', '1.803', '0.1111', '7.000', '0.7082', 1, 1, 1, 1, 1727125286.543022]