TEST_NAME : Wafer
TEST_DATE : 24_09_23-23_37_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-031-014-005-07 | FUSED_ID : 6359364768405446743
  IC_TEMP :  -65.95 | VDDM : 1133.89 | AUX_INT :   -8.54 | CsaBias :   71.44
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.44817e-03 / 2
  ADC_P0  : -8.53583e-03 ± 2.57852e-02
  ADC_P1  : 8.94947e-03 ± 6.69992e-04
  ADC_P2  : -7.05526e-06 ± 3.44048e-06
  CSA_Chi2/NDF : 2.00376e-04 / 2
  CSA_P0  : 5.82623e-02 ± 9.44159e-03
  CSA_P1  : 1.05513e-02 ± 7.11356e-04
  CSA_P2  : -5.62374e-05 ± 1.08331e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [28, 106]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3297', '1.800', '0.1805', '1.800', '0.0949', '7.000', '0.7077', 1, 1, 1, 1, 1727127464.6571376]
VI_after__Init : ['1.202', '0.3299', '1.800', '0.1805', '1.800', '0.0891', '7.000', '0.7076', 1, 1, 1, 1, 1727127472.8406355]
VI_at__the_End : ['1.202', '0.4958', '1.800', '0.1401', '1.802', '0.1144', '7.000', '0.7084', 1, 1, 1, 1, 1727127540.369437]