TEST_NAME : Wafer
TEST_DATE : 24_09_24-00_00_31
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-031-014-019-00 | FUSED_ID : 6359364768405446960
  IC_TEMP :  -57.17 | VDDM : 1108.44 | AUX_INT :   -5.72 | CsaBias :   83.10
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.16626e-03 / 2
  ADC_P0  : -5.72237e-03 ± 2.31764e-02
  ADC_P1  : 8.12921e-03 ± 5.65639e-04
  ADC_P2  : -4.97142e-06 ± 2.72573e-06
  CSA_Chi2/NDF : 1.10930e-04 / 2
  CSA_P0  : 5.87896e-02 ± 7.02502e-03
  CSA_P1  : 9.47154e-03 ± 5.29284e-04
  CSA_P2  : -4.28071e-05 ± 8.06037e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [73]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [20]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2647', '1.800', '0.1509', '1.800', '0.0881', '7.000', '0.7078', 1, 1, 1, 1, 1727128830.578774]
VI_after__Init : ['1.202', '0.2648', '1.800', '0.1509', '1.800', '0.0829', '7.000', '0.7080', 1, 1, 1, 1, 1727128839.2881193]
VI_at__the_End : ['1.202', '0.4819', '1.800', '0.1366', '1.800', '0.1119', '7.000', '0.7086', 1, 1, 1, 1, 1727128906.9222047]