TEST_NAME : Wafer
TEST_DATE : 24_09_24-00_36_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-031-015-011-10 | FUSED_ID : 6359364768405450938
  IC_TEMP :  -64.49 | VDDM : 1118.92 | AUX_INT :   -9.10 | CsaBias :   65.70
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.65452e-03 / 2
  ADC_P0  : -9.09895e-03 ± 2.75516e-02
  ADC_P1  : 8.36733e-03 ± 6.62724e-04
  ADC_P2  : -6.22473e-06 ± 3.16754e-06
  CSA_Chi2/NDF : 1.51339e-04 / 2
  CSA_P0  : 5.79592e-02 ± 8.20537e-03
  CSA_P1  : 9.43607e-03 ± 6.18216e-04
  CSA_P2  : -4.42249e-05 ± 9.41469e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [55, 65]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [62, 69, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3157', '1.800', '0.1443', '1.800', '0.0891', '7.000', '0.7079', 1, 1, 1, 1, 1727130981.0356977]
VI_after__Init : ['1.202', '0.3160', '1.800', '0.1436', '1.800', '0.0836', '7.000', '0.7081', 1, 1, 1, 1, 1727130989.14708]
VI_at__the_End : ['1.202', '0.4726', '1.800', '0.1363', '1.800', '0.1155', '7.000', '0.7085', 1, 1, 1, 1, 1727131049.7251885]