TEST_NAME : Wafer
TEST_DATE : 24_09_24-01_00_49
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-031-016-013-02 | FUSED_ID : 6359364768405455058
  IC_TEMP :  -54.02 | VDDM : 1125.81 | AUX_INT :   -7.86 | CsaBias :   80.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18187e-03 / 2
  ADC_P0  : -7.85745e-03 ± 2.32885e-02
  ADC_P1  : 8.09393e-03 ± 5.51267e-04
  ADC_P2  : -5.56145e-06 ± 2.58149e-06
  CSA_Chi2/NDF : 1.10833e-04 / 2
  CSA_P0  : 5.99632e-02 ± 7.02194e-03
  CSA_P1  : 9.60808e-03 ± 5.29052e-04
  CSA_P2  : -4.16128e-05 ± 8.05684e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [99]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2453', '1.800', '0.1722', '1.800', '0.0859', '7.000', '0.7073', 1, 1, 1, 1, 1727132449.3020358]
VI_after__Init : ['1.202', '0.2455', '1.800', '0.1722', '1.800', '0.0804', '7.000', '0.7072', 1, 1, 1, 1, 1727132457.428435]
VI_at__the_End : ['1.201', '0.4974', '1.800', '0.1348', '1.799', '0.1096', '7.000', '0.7080', 1, 1, 1, 1, 1727132525.4547176]