TEST_NAME : Wafer
TEST_DATE : 24_09_24-01_02_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-031-016-014-02 | FUSED_ID : 6359364768405455074
  IC_TEMP :  -54.47 | VDDM : 1128.27 | AUX_INT :   -8.04 | CsaBias :   73.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.22042e-03 / 2
  ADC_P0  : -8.04097e-03 ± 2.36804e-02
  ADC_P1  : 8.21713e-03 ± 5.73727e-04
  ADC_P2  : -5.44470e-06 ± 2.75495e-06
  CSA_Chi2/NDF : 1.41657e-04 / 2
  CSA_P0  : 6.00996e-02 ± 7.93855e-03
  CSA_P1  : 9.84879e-03 ± 5.98112e-04
  CSA_P2  : -4.47975e-05 ± 9.10854e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [77, 85, 102, 120, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [6]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3911', '1.800', '0.1460', '1.800', '0.0897', '7.000', '0.7081', 1, 1, 1, 1, 1727132546.8432143]
VI_after__Init : ['1.202', '0.3914', '1.800', '0.1460', '1.800', '0.0824', '7.000', '0.7072', 1, 1, 1, 1, 1727132554.9455693]
VI_at__the_End : ['1.202', '0.4986', '1.800', '0.1363', '1.800', '0.1124', '7.000', '0.7080', 1, 1, 1, 1, 1727132615.7283945]