TEST_NAME : Wafer
TEST_DATE : 24_09_24-01_44_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-031-018-009-01 | FUSED_ID : 6359364768405463185
  IC_TEMP :  -59.20 | VDDM : 1123.88 | AUX_INT :   -9.43 | CsaBias :   83.68
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.87085e-03 / 2
  ADC_P0  : -9.43276e-03 ± 2.93656e-02
  ADC_P1  : 8.53349e-03 ± 7.28958e-04
  ADC_P2  : -6.22392e-06 ± 3.58471e-06
  CSA_Chi2/NDF : 1.07002e-04 / 2
  CSA_P0  : 6.01715e-02 ± 6.89952e-03
  CSA_P1  : 9.24644e-03 ± 5.19829e-04
  CSA_P2  : -3.67327e-05 ± 7.91638e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [69, 82]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [8, 26, 70]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3392', '1.800', '0.1586', '1.800', '0.0886', '7.000', '0.7079', 1, 1, 1, 1, 1727135079.0681016]
VI_after__Init : ['1.202', '0.3392', '1.800', '0.1586', '1.800', '0.0834', '7.000', '0.7078', 1, 1, 1, 1, 1727135087.2844603]
VI_at__the_End : ['1.202', '0.4933', '1.800', '0.1366', '1.800', '0.1126', '7.000', '0.7084', 1, 1, 1, 1, 1727135152.7582834]