TEST_NAME : Wafer
TEST_DATE : 24_09_24-01_47_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-031-018-011-01 | FUSED_ID : 6359364768405463217
  IC_TEMP :  -54.31 | VDDM : 1118.65 | AUX_INT :  -18.24 | CsaBias :   75.06
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.58480e-03 / 2
  ADC_P0  : -1.82418e-02 ± 2.74646e-02
  ADC_P1  : 8.55337e-03 ± 6.68439e-04
  ADC_P2  : -6.49369e-06 ± 3.22915e-06
  CSA_Chi2/NDF : 1.05693e-04 / 2
  CSA_P0  : 5.86234e-02 ± 6.85718e-03
  CSA_P1  : 9.25988e-03 ± 5.16639e-04
  CSA_P2  : -3.75662e-05 ± 7.86780e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [5]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [6]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1380', '1.800', '0.1641', '1.800', '0.0824', '7.000', '0.7089', 1, 1, 1, 1, 1727135275.2577777]
VI_after__Init : ['1.202', '0.1381', '1.800', '0.1641', '1.800', '0.0753', '7.000', '0.7079', 1, 1, 1, 1, 1727135283.3210437]
VI_at__the_End : ['1.201', '0.4907', '1.800', '0.1350', '1.800', '0.1114', '7.000', '0.7087', 1, 1, 1, 1, 1727135347.2961752]