TEST_NAME : Wafer
TEST_DATE : 24_09_25-12_03_29
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-003-018-10 | FUSED_ID : 6359364768406450474
  IC_TEMP :  -60.28 | VDDM : 1119.62 | AUX_INT :   -7.39 | CsaBias :   61.44
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.51679e-04 / 2
  ADC_P0  : -7.38994e-03 ± 2.08457e-02
  ADC_P1  : 8.65719e-03 ± 5.23425e-04
  ADC_P2  : -6.73759e-06 ± 2.59454e-06
  CSA_Chi2/NDF : 1.40844e-04 / 2
  CSA_P0  : 5.99247e-02 ± 7.91573e-03
  CSA_P1  : 9.85489e-03 ± 5.96393e-04
  CSA_P2  : -4.59355e-05 ± 9.08236e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [44, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [41]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3711', '1.800', '0.1417', '1.800', '0.0966', '7.000', '0.7086', 1, 1, 1, 1, 1727258608.5810149]
VI_after__Init : ['1.201', '0.3716', '1.800', '0.1417', '1.800', '0.0886', '7.000', '0.7076', 1, 1, 1, 1, 1727258617.3833647]
VI_at__the_End : ['1.201', '0.4943', '1.800', '0.1388', '1.800', '0.1142', '7.000', '0.7083', 1, 1, 1, 1, 1727258677.0477264]