TEST_NAME : Wafer
TEST_DATE : 24_09_25-13_21_45
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-005-007-08 | FUSED_ID : 6359364768406458488
  IC_TEMP :  -65.75 | VDDM : 1112.56 | AUX_INT :   -8.25 | CsaBias :   76.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30088e-03 / 2
  ADC_P0  : -8.25387e-03 ± 2.44476e-02
  ADC_P1  : 8.55435e-03 ± 6.14021e-04
  ADC_P2  : -6.01049e-06 ± 3.05603e-06
  CSA_Chi2/NDF : 2.02083e-04 / 2
  CSA_P0  : 5.58131e-02 ± 9.48171e-03
  CSA_P1  : 1.03013e-02 ± 7.14379e-04
  CSA_P2  : -5.35638e-05 ± 1.08791e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [17, 40]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [36]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2398', '1.800', '0.1665', '1.800', '0.0908', '7.000', '0.7084', 1, 1, 1, 1, 1727263305.1744397]
VI_after__Init : ['1.201', '0.2397', '1.800', '0.1665', '1.800', '0.0850', '7.000', '0.7081', 1, 1, 1, 1, 1727263314.0087125]
VI_at__the_End : ['1.201', '0.4872', '1.800', '0.1415', '1.800', '0.1143', '7.000', '0.7090', 1, 1, 1, 1, 1727263373.2052472]