TEST_NAME : Wafer
TEST_DATE : 24_09_25-13_20_07
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-005-008-08 | FUSED_ID : 6359364768406458504
  IC_TEMP :  -58.39 | VDDM : 1117.31 | AUX_INT :   -7.55 | CsaBias :   81.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05407e-03 / 2
  ADC_P0  : -7.55398e-03 ± 2.19680e-02
  ADC_P1  : 8.19333e-03 ± 5.25990e-04
  ADC_P2  : -5.77269e-06 ± 2.48920e-06
  CSA_Chi2/NDF : 1.23280e-04 / 2
  CSA_P0  : 5.88564e-02 ± 7.40575e-03
  CSA_P1  : 9.59263e-03 ± 5.57970e-04
  CSA_P2  : -4.27791e-05 ± 8.49723e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [72, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [43]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3551', '1.800', '0.1806', '1.800', '0.0910', '7.000', '0.7079', 1, 1, 1, 1, 1727263207.7477057]
VI_after__Init : ['1.201', '0.3553', '1.800', '0.1806', '1.800', '0.0852', '7.000', '0.7079', 1, 1, 1, 1, 1727263215.793152]
VI_at__the_End : ['1.201', '0.4895', '1.800', '0.1376', '1.800', '0.1110', '7.000', '0.7088', 1, 1, 1, 1, 1727263281.583062]