TEST_NAME : Wafer
TEST_DATE : 24_09_25-13_34_47
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-006-007-06 | FUSED_ID : 6359364768406462582
  IC_TEMP :  -56.75 | VDDM : 1121.35 | AUX_INT :   -9.83 | CsaBias :   81.74
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.65188e-03 / 2
  ADC_P0  : -9.83076e-03 ± 2.75213e-02
  ADC_P1  : 8.39680e-03 ± 6.59965e-04
  ADC_P2  : -6.55861e-06 ± 3.13719e-06
  CSA_Chi2/NDF : 1.35168e-04 / 2
  CSA_P0  : 5.69889e-02 ± 7.75461e-03
  CSA_P1  : 9.60775e-03 ± 5.84254e-04
  CSA_P2  : -4.29071e-05 ± 8.89749e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [26]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2016', '1.800', '0.1543', '1.800', '0.0846', '7.000', '0.7076', 1, 1, 1, 1, 1727264087.3143191]
VI_after__Init : ['1.201', '0.2018', '1.800', '0.1543', '1.800', '0.0789', '7.000', '0.7075', 1, 1, 1, 1, 1727264095.356699]
VI_at__the_End : ['1.201', '0.4892', '1.800', '0.1381', '1.799', '0.1118', '7.000', '0.7083', 1, 1, 1, 1, 1727264162.9232578]