TEST_NAME : Wafer
TEST_DATE : 24_09_25-15_56_32
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-009-010-02 | FUSED_ID : 6359364768406474914
  IC_TEMP :  -63.68 | VDDM : 1124.81 | AUX_INT :   -6.86 | CsaBias :   70.39
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.33131e-04 / 2
  ADC_P0  : -6.85921e-03 ± 1.94606e-02
  ADC_P1  : 8.64929e-03 ± 4.81196e-04
  ADC_P2  : -7.36573e-06 ± 2.33665e-06
  CSA_Chi2/NDF : 1.44870e-04 / 2
  CSA_P0  : 5.98871e-02 ± 8.02809e-03
  CSA_P1  : 9.93875e-03 ± 6.04858e-04
  CSA_P2  : -4.72920e-05 ± 9.21128e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4604', '1.800', '0.1659', '1.800', '0.0969', '7.000', '0.7083', 1, 1, 1, 1, 1727272591.8792372]
VI_after__Init : ['1.201', '0.4613', '1.800', '0.1655', '1.800', '0.0894', '7.000', '0.7076', 1, 1, 1, 1, 1727272600.020635]
VI_at__the_End : ['1.201', '0.4943', '1.800', '0.1403', '1.799', '0.1121', '7.000', '0.7084', 1, 1, 1, 1, 1727272663.8005373]