TEST_NAME : Wafer
TEST_DATE : 24_09_25-18_06_56
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-012-021-14 | FUSED_ID : 6359364768406487390
  IC_TEMP :  -53.04 | VDDM : 1124.31 | AUX_INT :   -9.53 | CsaBias :   86.41
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.54087e-03 / 2
  ADC_P0  : -9.52560e-03 ± 2.65824e-02
  ADC_P1  : 8.06498e-03 ± 6.15872e-04
  ADC_P2  : -5.87385e-06 ± 2.82902e-06
  CSA_Chi2/NDF : 7.16199e-05 / 2
  CSA_P0  : 5.78704e-02 ± 5.64468e-03
  CSA_P1  : 9.60377e-03 ± 4.25286e-04
  CSA_P2  : -3.96865e-05 ± 6.47660e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [93, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [42]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3507', '1.800', '0.1422', '1.800', '0.0936', '7.000', '0.7084', 1, 1, 1, 1, 1727280416.7311947]
VI_after__Init : ['1.202', '0.3508', '1.800', '0.1422', '1.800', '0.0866', '7.000', '0.7079', 1, 1, 1, 1, 1727280424.793708]
VI_at__the_End : ['1.201', '0.5029', '1.799', '0.1386', '1.799', '0.1107', '7.000', '0.7086', 1, 1, 1, 1, 1727280483.871303]