TEST_NAME : Wafer
TEST_DATE : 24_09_25-18_15_06
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-012-026-14 | FUSED_ID : 6359364768406487470
  IC_TEMP :  -54.74 | VDDM : 1116.87 | AUX_INT :  -10.08 | CsaBias :   90.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.52221e-03 / 2
  ADC_P0  : -1.00786e-02 ± 2.64273e-02
  ADC_P1  : 7.76439e-03 ± 5.94490e-04
  ADC_P2  : -4.98723e-06 ± 2.67115e-06
  CSA_Chi2/NDF : 8.03912e-05 / 2
  CSA_P0  : 5.70834e-02 ± 5.98035e-03
  CSA_P1  : 9.50669e-03 ± 4.50576e-04
  CSA_P2  : -3.91607e-05 ± 6.86174e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [46, 105]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [72]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2043', '1.800', '0.1481', '1.800', '0.0863', '7.000', '0.7079', 1, 1, 1, 1, 1727280905.830005]
VI_after__Init : ['1.202', '0.2043', '1.800', '0.1476', '1.801', '0.0807', '7.000', '0.7079', 1, 1, 1, 1, 1727280913.9744542]
VI_at__the_End : ['1.201', '0.4952', '1.800', '0.1329', '1.804', '0.1101', '7.000', '0.7087', 1, 1, 1, 1, 1727280979.4295125]