TEST_NAME : Wafer
TEST_DATE : 24_09_25-21_22_09
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-018-018-11 | FUSED_ID : 6359364768406511915
  IC_TEMP :  -52.00 | VDDM : 1124.04 | AUX_INT :   -5.48 | CsaBias :   92.72
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 6.70169e-04 / 2
  ADC_P0  : -5.47741e-03 ± 1.75253e-02
  ADC_P1  : 7.61064e-03 ± 4.00471e-04
  ADC_P2  : -4.41075e-06 ± 1.80525e-06
  CSA_Chi2/NDF : 6.44035e-05 / 2
  CSA_P0  : 6.06540e-02 ± 5.35275e-03
  CSA_P1  : 9.23760e-03 ± 4.03291e-04
  CSA_P2  : -3.42445e-05 ± 6.14165e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [44, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [15]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2859', '1.800', '0.1442', '1.800', '0.0887', '7.000', '0.7072', 1, 1, 1, 1, 1727292129.5569515]
VI_after__Init : ['1.202', '0.2859', '1.800', '0.1442', '1.800', '0.0835', '7.000', '0.7069', 1, 1, 1, 1, 1727292137.645285]
VI_at__the_End : ['1.202', '0.5039', '1.800', '0.1370', '1.800', '0.1117', '7.000', '0.7079', 1, 1, 1, 1, 1727292203.348247]