TEST_NAME : Wafer
TEST_DATE : 24_09_30-14_37_46
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-007-015-10 | FUSED_ID : 6359364768409612538
  IC_TEMP :  -58.88 | VDDM : 1117.48 | AUX_INT :   -9.65 | CsaBias :   74.71
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.44508e-03 / 2
  ADC_P0  : -9.65129e-03 ± 2.57188e-02
  ADC_P1  : 8.50217e-03 ± 6.25829e-04
  ADC_P2  : -6.58641e-06 ± 3.02341e-06
  CSA_Chi2/NDF : 1.16404e-04 / 2
  CSA_P0  : 5.66969e-02 ± 7.19625e-03
  CSA_P1  : 9.71016e-03 ± 5.42185e-04
  CSA_P2  : -4.52402e-05 ± 8.25684e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1433', '1.800', '0.1338', '1.800', '0.0838', '7.000', '0.7079', 1, 1, 1, 1, 1727699865.536331]
VI_after__Init : ['1.202', '0.1433', '1.800', '0.1337', '1.800', '0.0785', '7.000', '0.7081', 1, 1, 1, 1, 1727699873.6308496]
VI_at__the_End : ['1.201', '0.4826', '1.800', '0.1368', '1.800', '0.1118', '7.000', '0.7086', 1, 1, 1, 1, 1727699935.0303319]