TEST_NAME : Wafer
TEST_DATE : 24_10_01-18_32_59
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-008-013-04 | FUSED_ID : 6359364768410665172
  IC_TEMP :  -55.94 | VDDM : 1125.34 | AUX_INT :   -9.08 | CsaBias :   76.54
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26737e-03 / 2
  ADC_P0  : -9.08451e-03 ± 2.40485e-02
  ADC_P1  : 8.63420e-03 ± 5.90215e-04
  ADC_P2  : -7.14254e-06 ± 2.86642e-06
  CSA_Chi2/NDF : 9.45361e-05 / 2
  CSA_P0  : 5.94744e-02 ± 6.48517e-03
  CSA_P1  : 9.32042e-03 ± 4.88611e-04
  CSA_P2  : -3.87155e-05 ± 7.44096e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [70]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [24]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1314', '1.800', '0.1711', '1.800', '0.0845', '7.000', '0.7070', 1, 1, 1, 1, 1727800378.619017]
VI_after__Init : ['1.202', '0.1314', '1.800', '0.1711', '1.800', '0.0790', '7.000', '0.7069', 1, 1, 1, 1, 1727800387.5353065]
VI_at__the_End : ['1.201', '0.4896', '1.800', '0.1385', '1.800', '0.1098', '7.000', '0.7076', 1, 1, 1, 1, 1727800446.0592725]