TEST_NAME : Wafer
TEST_DATE : 24_10_02-00_27_52
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-017-012-09 | FUSED_ID : 6359364768410702025
  IC_TEMP :  -54.70 | VDDM : 1100.41 | AUX_INT :   -6.34 | CsaBias :   65.23
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01517e-03 / 2
  ADC_P0  : -6.34055e-03 ± 2.15679e-02
  ADC_P1  : 7.99978e-03 ± 5.08857e-04
  ADC_P2  : -5.27966e-06 ± 2.37231e-06
  CSA_Chi2/NDF : 1.85559e-04 / 2
  CSA_P0  : 5.67857e-02 ± 9.08580e-03
  CSA_P1  : 9.92659e-03 ± 6.84550e-04
  CSA_P2  : -5.00803e-05 ± 1.04249e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [12, 61]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.5022', '1.800', '0.1233', '1.800', '0.0929', '7.000', '0.7077', 1, 1, 1, 1, 1727821672.2804813]
VI_after__Init : ['1.202', '0.5027', '1.800', '0.1233', '1.800', '0.0876', '7.000', '0.7076', 1, 1, 1, 1, 1727821680.2828596]
VI_at__the_End : ['1.202', '0.4794', '1.800', '0.1330', '1.803', '0.1152', '7.000', '0.7086', 1, 1, 1, 1, 1727821746.8636932]