TEST_NAME : Wafer
TEST_DATE : 24_10_08-13_42_47
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-005-008-11 | FUSED_ID : 6359364768411701387
  IC_TEMP :  -61.98 | VDDM : 1116.36 | AUX_INT :   -9.97 | CsaBias :   73.20
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.56789e-03 / 2
  ADC_P0  : -9.96532e-03 ± 2.68289e-02
  ADC_P1  : 8.37751e-03 ± 6.47349e-04
  ADC_P2  : -6.08223e-06 ± 3.11109e-06
  CSA_Chi2/NDF : 1.80531e-04 / 2
  CSA_P0  : 5.73937e-02 ± 8.96186e-03
  CSA_P1  : 9.98426e-03 ± 6.75212e-04
  CSA_P2  : -4.88502e-05 ± 1.02827e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  [43]
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [56]
 | P_BROKEN_SLOW :  [43]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4183', '1.800', '0.1817', '1.799', '0.0944', '7.001', '0.7079', 1, 1, 1, 1, 1728387767.3563964]
VI_after__Init : ['1.202', '0.4187', '1.800', '0.1817', '1.800', '0.0891', '7.000', '0.7079', 1, 1, 1, 1, 1728387775.3816576]
VI_at__the_End : ['1.202', '0.4879', '1.800', '0.1395', '1.800', '0.1111', '7.000', '0.7086', 1, 1, 1, 1, 1728387842.881446]