TEST_NAME : Wafer
TEST_DATE : 24_10_08-14_07_28
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-014-011-09 | FUSED_ID : 6359364768411738297
  IC_TEMP :  -65.46 | VDDM : 1106.54 | AUX_INT :   -9.20 | CsaBias :   65.07
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35453e-03 / 2
  ADC_P0  : -9.19524e-03 ± 2.49105e-02
  ADC_P1  : 8.30670e-03 ± 5.97162e-04
  ADC_P2  : -6.07760e-06 ± 2.84128e-06
  CSA_Chi2/NDF : 1.82521e-04 / 2
  CSA_P0  : 5.82857e-02 ± 9.01113e-03
  CSA_P1  : 1.00769e-02 ± 6.78924e-04
  CSA_P2  : -5.29389e-05 ± 1.03392e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [58, 86]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [114, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4564', '1.800', '0.1622', '1.800', '0.1017', '7.000', '0.7080', 1, 1, 1, 1, 1728389247.996836]
VI_after__Init : ['1.201', '0.4576', '1.800', '0.1624', '1.800', '0.0952', '7.000', '0.7072', 1, 1, 1, 1, 1728389256.109107]
VI_at__the_End : ['1.202', '0.4770', '1.800', '0.1348', '1.800', '0.1102', '7.000', '0.7083', 1, 1, 1, 1, 1728389321.1811862]