TEST_NAME : Wafer
TEST_DATE : 24_10_07-15_43_45
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-002-010-10 | FUSED_ID : 6359364768413786282
  IC_TEMP :  -94.81 | VDDM : 1098.09 | AUX_INT :  -11.73 | CsaBias :   25.55
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.88507e-03 / 2
  ADC_P0  : -1.17287e-02 ± 2.93293e-02
  ADC_P1  : 9.35586e-03 ± 7.61944e-04
  ADC_P2  : -8.79009e-06 ± 3.94444e-06
  CSA_Chi2/NDF : 1.59481e-04 / 2
  CSA_P0  : 5.64549e-02 ± 8.42319e-03
  CSA_P1  : 1.06170e-02 ± 6.34627e-04
  CSA_P2  : -7.23134e-05 ± 9.66461e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [58, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [20, 99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3337', '1.800', '0.1530', '1.799', '0.0987', '7.000', '0.7083', 1, 1, 1, 1, 1728308624.891815]
VI_after__Init : ['1.201', '0.3353', '1.800', '0.1541', '1.800', '0.0929', '7.000', '0.7083', 1, 1, 1, 1, 1728308633.4341645]
VI_at__the_End : ['1.201', '0.4322', '1.800', '0.1342', '1.799', '0.1236', '7.000', '0.7088', 1, 1, 1, 1, 1728308686.6462023]