TEST_NAME : Wafer
TEST_DATE : 24_10_07-15_45_23
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-002-011-10 | FUSED_ID : 6359364768413786298
  IC_TEMP :  -83.53 | VDDM : 1122.63 | AUX_INT :  -10.45 | CsaBias :   53.06
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.85370e-03 / 2
  ADC_P0  : -1.04502e-02 ± 2.91494e-02
  ADC_P1  : 9.12893e-03 ± 7.51724e-04
  ADC_P2  : -8.09524e-06 ± 3.84104e-06
  CSA_Chi2/NDF : 2.38243e-04 / 2
  CSA_P0  : 5.75614e-02 ± 1.02951e-02
  CSA_P1  : 1.02238e-02 ± 7.75664e-04
  CSA_P2  : -6.21999e-05 ± 1.18124e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [14, 46, 118, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [6, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2112', '1.800', '0.1368', '1.799', '0.0905', '7.000', '0.7083', 1, 1, 1, 1, 1728308722.6583226]
VI_after__Init : ['1.201', '0.2114', '1.800', '0.1369', '1.800', '0.0850', '7.000', '0.7083', 1, 1, 1, 1, 1728308731.3766248]
VI_at__the_End : ['1.201', '0.4526', '1.800', '0.1334', '1.804', '0.1230', '7.000', '0.7086', 1, 1, 1, 1, 1728308797.264583]