TEST_NAME : Wafer
TEST_DATE : 24_10_07-15_47_02
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-002-012-10 | FUSED_ID : 6359364768413786314
  IC_TEMP :  -79.76 | VDDM : 1111.20 | AUX_INT :  -11.89 | CsaBias :   58.51
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.17374e-03 / 2
  ADC_P0  : -1.18854e-02 ± 3.15881e-02
  ADC_P1  : 8.85774e-03 ± 7.88467e-04
  ADC_P2  : -7.35083e-06 ± 3.92705e-06
  CSA_Chi2/NDF : 1.90629e-04 / 2
  CSA_P0  : 5.64957e-02 ± 9.20909e-03
  CSA_P1  : 9.88852e-03 ± 6.93839e-04
  CSA_P2  : -5.73088e-05 ± 1.05663e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2904', '1.800', '0.1666', '1.800', '0.1030', '7.000', '0.7082', 1, 1, 1, 1, 1728308821.7585745]
VI_after__Init : ['1.201', '0.2904', '1.800', '0.1670', '1.799', '0.0971', '7.000', '0.7083', 1, 1, 1, 1, 1728308830.5710096]
VI_at__the_End : ['1.201', '0.4467', '1.800', '0.1323', '1.803', '0.1232', '7.000', '0.7091', 1, 1, 1, 1, 1728308893.7470942]