TEST_NAME : Wafer
TEST_DATE : 24_10_07-15_51_57
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-002-015-10 | FUSED_ID : 6359364768413786362
  IC_TEMP :  -82.39 | VDDM : 1117.89 | AUX_INT :  -10.26 | CsaBias :   54.14
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.62317e-03 / 2
  ADC_P0  : -1.02613e-02 ± 2.72510e-02
  ADC_P1  : 9.25744e-03 ± 7.13859e-04
  ADC_P2  : -8.21049e-06 ± 3.71147e-06
  CSA_Chi2/NDF : 2.00019e-04 / 2
  CSA_P0  : 5.63841e-02 ± 9.43318e-03
  CSA_P1  : 1.02136e-02 ± 7.10722e-04
  CSA_P2  : -6.22105e-05 ± 1.08235e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [59, 70, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2673', '1.800', '0.1203', '1.800', '0.0985', '7.000', '0.7081', 1, 1, 1, 1, 1728309116.3098814]
VI_after__Init : ['1.199', '0.2676', '1.800', '0.1207', '1.802', '0.0927', '7.000', '0.7080', 1, 1, 1, 1, 1728309125.65624]
VI_at__the_End : ['1.201', '0.4502', '1.800', '0.1349', '1.805', '0.1236', '7.000', '0.7086', 1, 1, 1, 1, 1728309183.4637775]