TEST_NAME : Wafer
TEST_DATE : 24_10_07-15_53_35
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-002-016-13 | FUSED_ID : 6359364768413786381
  IC_TEMP :  -74.57 | VDDM : 1115.02 | AUX_INT :  -10.78 | CsaBias :   64.61
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.87481e-03 / 2
  ADC_P0  : -1.07764e-02 ± 2.93592e-02
  ADC_P1  : 8.43164e-03 ± 7.10835e-04
  ADC_P2  : -6.17552e-06 ± 3.43188e-06
  CSA_Chi2/NDF : 2.08621e-04 / 2
  CSA_P0  : 5.52396e-02 ± 9.63389e-03
  CSA_P1  : 1.02459e-02 ± 7.25844e-04
  CSA_P2  : -5.97775e-05 ± 1.10537e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1210', '1.800', '0.1647', '1.800', '0.0859', '7.000', '0.7079', 1, 1, 1, 1, 1728309215.0543675]
VI_after__Init : ['1.201', '0.1209', '1.800', '0.1648', '1.799', '0.0808', '7.000', '0.7079', 1, 1, 1, 1, 1728309223.5886698]
VI_at__the_End : ['1.201', '0.4608', '1.800', '0.1328', '1.804', '0.1199', '7.000', '0.7084', 1, 1, 1, 1, 1728309291.5765522]