TEST_NAME : Wafer
TEST_DATE : 24_10_07-15_56_52
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-002-018-13 | FUSED_ID : 6359364768413786413
  IC_TEMP :  -80.52 | VDDM : 1117.61 | AUX_INT :  -11.91 | CsaBias :   50.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.21264e-03 / 2
  ADC_P0  : -1.19135e-02 ± 3.18810e-02
  ADC_P1  : 9.03218e-03 ± 8.12844e-04
  ADC_P2  : -7.58990e-06 ± 4.13398e-06
  CSA_Chi2/NDF : 1.75958e-04 / 2
  CSA_P0  : 5.71279e-02 ± 8.84764e-03
  CSA_P1  : 9.84653e-03 ± 6.66605e-04
  CSA_P2  : -5.65652e-05 ± 1.01516e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [16, 51, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2243', '1.800', '0.1648', '1.800', '0.0896', '7.000', '0.7076', 1, 1, 1, 1, 1728309412.3872747]
VI_after__Init : ['1.201', '0.2244', '1.800', '0.1648', '1.799', '0.0841', '7.000', '0.7077', 1, 1, 1, 1, 1728309420.5685692]
VI_at__the_End : ['1.201', '0.4462', '1.800', '0.1328', '1.799', '0.1232', '7.000', '0.7081', 1, 1, 1, 1, 1728309479.483999]