TEST_NAME : Wafer
TEST_DATE : 24_10_07-15_58_31
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-002-019-13 | FUSED_ID : 6359364768413786429
  IC_TEMP :  -81.38 | VDDM : 1103.04 | AUX_INT :  -10.61 | CsaBias :   50.05
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.73714e-03 / 2
  ADC_P0  : -1.06099e-02 ± 2.82473e-02
  ADC_P1  : 8.71072e-03 ± 7.08748e-04
  ADC_P2  : -6.45416e-06 ± 3.55076e-06
  CSA_Chi2/NDF : 2.66295e-04 / 2
  CSA_P0  : 5.80907e-02 ± 1.08844e-02
  CSA_P1  : 1.08064e-02 ± 8.20060e-04
  CSA_P2  : -7.05641e-05 ± 1.24885e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [99, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [58, 88, 100]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3262', '1.800', '0.1271', '1.800', '0.0897', '7.000', '0.7075', 1, 1, 1, 1, 1728309511.3705628]
VI_after__Init : ['1.201', '0.3249', '1.800', '0.1272', '1.799', '0.0850', '7.000', '0.7076', 1, 1, 1, 1, 1728309519.6339612]
VI_at__the_End : ['1.201', '0.4599', '1.800', '0.1383', '1.805', '0.1167', '7.000', '0.7083', 1, 1, 1, 1, 1728309589.1585455]