TEST_NAME : Wafer
TEST_DATE : 24_10_07-16_21_31
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-003-009-07 | FUSED_ID : 6359364768413790359
  IC_TEMP :  -78.62 | VDDM : 1117.03 | AUX_INT :  -10.51 | CsaBias :   67.86
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.98540e-03 / 2
  ADC_P0  : -1.05104e-02 ± 3.02258e-02
  ADC_P1  : 8.76927e-03 ± 7.60394e-04
  ADC_P2  : -6.84933e-06 ± 3.80246e-06
  CSA_Chi2/NDF : 1.92083e-04 / 2
  CSA_P0  : 5.74471e-02 ± 9.24415e-03
  CSA_P1  : 1.00201e-02 ± 6.96480e-04
  CSA_P2  : -5.63258e-05 ± 1.06066e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [51]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [27, 39, 42, 99, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2760', '1.800', '0.1850', '1.800', '0.0954', '7.000', '0.7074', 1, 1, 1, 1, 1728310890.9040852]
VI_after__Init : ['1.200', '0.2762', '1.800', '0.1853', '1.800', '0.0899', '7.000', '0.7075', 1, 1, 1, 1, 1728310899.0324047]
VI_at__the_End : ['1.201', '0.4605', '1.800', '0.1363', '1.800', '0.1214', '7.000', '0.7082', 1, 1, 1, 1, 1728310955.3539946]