TEST_NAME : Wafer
TEST_DATE : 24_10_07-16_16_35
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-003-012-07 | FUSED_ID : 6359364768413790407
  IC_TEMP :  -74.55 | VDDM : 1091.38 | AUX_INT :   -9.71 | CsaBias :   64.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.74079e-03 / 2
  ADC_P0  : -9.70971e-03 ± 2.83323e-02
  ADC_P1  : 8.34817e-03 ± 6.93360e-04
  ADC_P2  : -5.52373e-06 ± 3.37906e-06
  CSA_Chi2/NDF : 1.74911e-04 / 2
  CSA_P0  : 5.61269e-02 ± 8.82128e-03
  CSA_P1  : 9.51724e-03 ± 6.64620e-04
  CSA_P2  : -5.59215e-05 ± 1.01214e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [55]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [97]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2809', '1.800', '0.1605', '1.799', '0.0940', '7.000', '0.7072', 1, 1, 1, 1, 1728310595.2946186]
VI_after__Init : ['1.202', '0.2813', '1.800', '0.1606', '1.801', '0.0884', '7.000', '0.7072', 1, 1, 1, 1, 1728310603.49997]
VI_at__the_End : ['1.201', '0.4291', '1.800', '0.1307', '1.799', '0.1228', '7.000', '0.7077', 1, 1, 1, 1, 1728310664.1713665]