TEST_NAME : Wafer
TEST_DATE : 24_10_07-16_14_56
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-003-013-07 | FUSED_ID : 6359364768413790423
  IC_TEMP :  -72.12 | VDDM : 1110.52 | AUX_INT :  -10.49 | CsaBias :   74.65
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.73562e-03 / 2
  ADC_P0  : -1.04863e-02 ± 2.82072e-02
  ADC_P1  : 8.58208e-03 ± 6.88767e-04
  ADC_P2  : -6.80894e-06 ± 3.34280e-06
  CSA_Chi2/NDF : 1.90705e-04 / 2
  CSA_P0  : 5.70053e-02 ± 9.21094e-03
  CSA_P1  : 9.79454e-03 ± 6.93978e-04
  CSA_P2  : -5.44496e-05 ± 1.05685e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3206', '1.800', '0.1269', '1.800', '0.0946', '7.000', '0.7072', 1, 1, 1, 1, 1728310495.6122866]
VI_after__Init : ['1.201', '0.3211', '1.800', '0.1269', '1.800', '0.0888', '7.000', '0.7074', 1, 1, 1, 1, 1728310504.5486255]
VI_at__the_End : ['1.201', '0.4551', '1.800', '0.1327', '1.804', '0.1196', '7.000', '0.7076', 1, 1, 1, 1, 1728310572.3274155]