TEST_NAME : Wafer
TEST_DATE : 24_10_07-16_10_01
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-003-016-00 | FUSED_ID : 6359364768413790464
  IC_TEMP :  -72.33 | VDDM : 1120.87 | AUX_INT :   -8.68 | CsaBias :   59.82
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.39445e-03 / 2
  ADC_P0  : -8.68476e-03 ± 2.52842e-02
  ADC_P1  : 8.61690e-03 ± 6.29520e-04
  ADC_P2  : -6.65410e-06 ± 3.10068e-06
  CSA_Chi2/NDF : 1.63076e-04 / 2
  CSA_P0  : 5.65674e-02 ± 8.51759e-03
  CSA_P1  : 9.74004e-03 ± 6.41739e-04
  CSA_P2  : -5.14768e-05 ± 9.77293e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [76]
 | N_BROKEN_SLOW :  [22]
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [39, 105]
 | P_BROKEN_SLOW :  [22]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3638', '1.800', '0.1410', '1.800', '0.0989', '7.000', '0.7079', 1, 1, 1, 1, 1728310200.8538125]
VI_after__Init : ['1.201', '0.3638', '1.800', '0.1415', '1.800', '0.0917', '7.000', '0.7071', 1, 1, 1, 1, 1728310208.9690924]
VI_at__the_End : ['1.201', '0.4555', '1.800', '0.1351', '1.811', '0.1201', '7.000', '0.7079', 1, 1, 1, 1, 1728310271.0713797]