TEST_NAME : Wafer
TEST_DATE : 24_10_07-16_08_22
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-003-017-00 | FUSED_ID : 6359364768413790480
  IC_TEMP :  -77.02 | VDDM : 1115.12 | AUX_INT :  -10.01 | CsaBias :   59.14
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.52721e-03 / 2
  ADC_P0  : -1.00070e-02 ± 2.64278e-02
  ADC_P1  : 8.70068e-03 ± 6.52925e-04
  ADC_P2  : -7.12072e-06 ± 3.20348e-06
  CSA_Chi2/NDF : 1.92709e-04 / 2
  CSA_P0  : 5.65292e-02 ± 9.25921e-03
  CSA_P1  : 1.00481e-02 ± 6.97615e-04
  CSA_P2  : -5.82006e-05 ± 1.06238e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [61, 84]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [50, 111, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2250', '1.800', '0.1567', '1.800', '0.0939', '7.000', '0.7071', 1, 1, 1, 1, 1728310102.528351]
VI_after__Init : ['1.202', '0.2250', '1.800', '0.1567', '1.800', '0.0884', '7.000', '0.7074', 1, 1, 1, 1, 1728310110.8246207]
VI_at__the_End : ['1.201', '0.4574', '1.800', '0.1324', '1.804', '0.1212', '7.000', '0.7081', 1, 1, 1, 1, 1728310171.5069282]