TEST_NAME : Wafer
TEST_DATE : 24_10_07-16_06_44
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-003-018-00 | FUSED_ID : 6359364768413790496
  IC_TEMP :  -74.76 | VDDM : 1115.23 | AUX_INT :  -10.57 | CsaBias :   73.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.80883e-03 / 2
  ADC_P0  : -1.05681e-02 ± 2.88380e-02
  ADC_P1  : 8.43741e-03 ± 6.98216e-04
  ADC_P2  : -6.21398e-06 ± 3.37096e-06
  CSA_Chi2/NDF : 1.50749e-04 / 2
  CSA_P0  : 5.83251e-02 ± 8.18935e-03
  CSA_P1  : 9.97858e-03 ± 6.17008e-04
  CSA_P2  : -5.52521e-05 ± 9.39630e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [4, 41, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [27, 30]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4048', '1.800', '0.1893', '1.800', '0.0984', '7.000', '0.7072', 1, 1, 1, 1, 1728310003.8678312]
VI_after__Init : ['1.201', '0.3996', '1.800', '0.1905', '1.800', '0.0926', '7.000', '0.7071', 1, 1, 1, 1, 1728310011.8762946]
VI_at__the_End : ['1.201', '0.4616', '1.800', '0.1349', '1.800', '0.1196', '7.000', '0.7078', 1, 1, 1, 1, 1728310074.7034268]