TEST_NAME : Wafer
TEST_DATE : 24_10_07-16_03_27
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-003-020-00 | FUSED_ID : 6359364768413790528
  IC_TEMP :  -71.99 | VDDM : 1117.10 | AUX_INT :   -9.58 | CsaBias :   67.95
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.61179e-03 / 2
  ADC_P0  : -9.57539e-03 ± 2.72128e-02
  ADC_P1  : 8.67284e-03 ± 6.82141e-04
  ADC_P2  : -6.54696e-06 ± 3.39496e-06
  CSA_Chi2/NDF : 1.60601e-04 / 2
  CSA_P0  : 5.91166e-02 ± 8.45273e-03
  CSA_P1  : 1.00023e-02 ± 6.36852e-04
  CSA_P2  : -5.44745e-05 ± 9.69851e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [53]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2096', '1.800', '0.1411', '1.799', '0.0914', '7.000', '0.7074', 1, 1, 1, 1, 1728309807.0219219]
VI_after__Init : ['1.201', '0.2097', '1.800', '0.1411', '1.800', '0.0861', '7.000', '0.7075', 1, 1, 1, 1, 1728309815.117338]
VI_at__the_End : ['1.197', '0.4686', '1.800', '0.1360', '1.809', '0.1211', '7.000', '0.7080', 1, 1, 1, 1, 1728309879.0554628]